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42 ELECTROCHEMICAL FLUORIDE REMOVAL IN SEMICONDUCTOR WASTEWATER Susan L. Cook, Environmental Engineer Standard Microsystems Corporation Hauppauge, New York 11788 Kevin D. Uhrich, Chief Process Engineer Andco Environmental Processes, Inc. Amherst, New York 14150 INTRODUCTION Standard Microsystems Corporation (SMC) is a microelectronics manufacturing company involved in the design, development, manufacture and sales of various integrated circuits and board level products. The company's products are used in small business and personal computers, as well as in data communications, computer terminals, and other peripheral equipment and telecommunications equipment. In addition, the company manufacturers a wide variety of digital logic devices for industrial and commercial applications. The fabrication of microelectronic devices is a highly sophisticated industry which employs repeated photolithographic masking, etching and oxidation processes, high temperature diffusion methods, ion implantation techniques and metal deposition under high vacuum. Up to one million electrical components are constructed in this fashion per square centimeter. The manufacturing environment is strictly controlled for temperature, humidity, and particulate contamination. Wafer surfaces must be kept clean from ionic deposits, as well as particulate matter. Ultrapure chemicals are used in the process and ultrapure water is required to rinse impurities from the wafer surface. A sophisticated water purification system is employed to provide this supply of ultrapure DI water. Some of the DI water specifications are: resistivity > 17.8 Megohm-cm, total organic carbon of < 20 /»g/L, and total bacterial count of < 10 colony forming units per 100 mL. Process solutions of ultrapure inorganic acids, semiconductor or electronic grade only, (with impurity levels in the microgram per liter range) are used for cleaning and etching the wafer surfaces. The rinse waters from these processes are a major source of wastewater in the manufacturing process. Other wastewater sources include the regeneration water from ion exchange operations and spent DI water (resistivity < 0.5 Megohm-cm). These sources will be discussed in further detail in a later section. REGULATORY BACKGROUND Standard Microsystems Corporation is located in Suffolk County, New York, an area of Long Island served by a public water supply which relies on a sole source groundwater aquifer. New York State has also maintained groundwater quality standards which typically dictate discharge standards for industrial and municipal effluents requiring groundwater disposal. SMC's SPDES permit reflects the groundwater standards for the state and are much more stringent than the pretreatment standards required by semiconductor industries served by municipal sewers. Table I compares SMC's SPDES permit limits with the pretreatment standards for the electrical and electronic industry category. SMC was issued a SPDES permit in 1981 with effluent limits listed in Table I. By 1984, the NYS Department of Environmental Conservation (DEC) issued an order of consent to SMC for compliance with its SPDES permit. At that time SMC had installed alumina columns and lime precipitation for fluoride removal and pH control. It was clear, however, that this technology was not successful in attaining the permit limits. By 1986, after SMC had unsuccessfully redesigned the alumina columns, DEC informed SMC that either a permit variance or a consent order continuance had to be requested. 44th Purdue Industrial Waste Conference Proceedings, © 1990 Lewis Publishers, Inc., Chelsea, Michigan 48118. Printed in U.S.A. 373
Object Description
Purdue Identification Number | ETRIWC198942 |
Title | Electrochemical fluoride removal in semiconductor wastewater |
Author |
Cook, Susan L. Uhrich, Kevin D. |
Date of Original | 1989 |
Conference Title | Proceedings of the 44th Industrial Waste Conference |
Conference Front Matter (copy and paste) | http://e-archives.lib.purdue.edu/u?/engext,40757 |
Extent of Original | p. 373-384 |
Collection Title | Engineering Technical Reports Collection, Purdue University |
Repository | Purdue University Libraries |
Rights Statement | Digital object copyright Purdue University. All rights reserved. |
Language | eng |
Type (DCMI) | text |
Format | JP2 |
Date Digitized | 2009-08-18 |
Capture Device | Fujitsu fi-5650C |
Capture Details | ScandAll 21 |
Resolution | 300 ppi |
Color Depth | 8 bit |
Description
Title | page 373 |
Collection Title | Engineering Technical Reports Collection, Purdue University |
Repository | Purdue University Libraries |
Rights Statement | Digital copyright Purdue University. All rights reserved. |
Language | eng |
Type (DCMI) | text |
Format | JP2 |
Capture Device | Fujitsu fi-5650C |
Capture Details | ScandAll 21 |
Transcript | 42 ELECTROCHEMICAL FLUORIDE REMOVAL IN SEMICONDUCTOR WASTEWATER Susan L. Cook, Environmental Engineer Standard Microsystems Corporation Hauppauge, New York 11788 Kevin D. Uhrich, Chief Process Engineer Andco Environmental Processes, Inc. Amherst, New York 14150 INTRODUCTION Standard Microsystems Corporation (SMC) is a microelectronics manufacturing company involved in the design, development, manufacture and sales of various integrated circuits and board level products. The company's products are used in small business and personal computers, as well as in data communications, computer terminals, and other peripheral equipment and telecommunications equipment. In addition, the company manufacturers a wide variety of digital logic devices for industrial and commercial applications. The fabrication of microelectronic devices is a highly sophisticated industry which employs repeated photolithographic masking, etching and oxidation processes, high temperature diffusion methods, ion implantation techniques and metal deposition under high vacuum. Up to one million electrical components are constructed in this fashion per square centimeter. The manufacturing environment is strictly controlled for temperature, humidity, and particulate contamination. Wafer surfaces must be kept clean from ionic deposits, as well as particulate matter. Ultrapure chemicals are used in the process and ultrapure water is required to rinse impurities from the wafer surface. A sophisticated water purification system is employed to provide this supply of ultrapure DI water. Some of the DI water specifications are: resistivity > 17.8 Megohm-cm, total organic carbon of < 20 /»g/L, and total bacterial count of < 10 colony forming units per 100 mL. Process solutions of ultrapure inorganic acids, semiconductor or electronic grade only, (with impurity levels in the microgram per liter range) are used for cleaning and etching the wafer surfaces. The rinse waters from these processes are a major source of wastewater in the manufacturing process. Other wastewater sources include the regeneration water from ion exchange operations and spent DI water (resistivity < 0.5 Megohm-cm). These sources will be discussed in further detail in a later section. REGULATORY BACKGROUND Standard Microsystems Corporation is located in Suffolk County, New York, an area of Long Island served by a public water supply which relies on a sole source groundwater aquifer. New York State has also maintained groundwater quality standards which typically dictate discharge standards for industrial and municipal effluents requiring groundwater disposal. SMC's SPDES permit reflects the groundwater standards for the state and are much more stringent than the pretreatment standards required by semiconductor industries served by municipal sewers. Table I compares SMC's SPDES permit limits with the pretreatment standards for the electrical and electronic industry category. SMC was issued a SPDES permit in 1981 with effluent limits listed in Table I. By 1984, the NYS Department of Environmental Conservation (DEC) issued an order of consent to SMC for compliance with its SPDES permit. At that time SMC had installed alumina columns and lime precipitation for fluoride removal and pH control. It was clear, however, that this technology was not successful in attaining the permit limits. By 1986, after SMC had unsuccessfully redesigned the alumina columns, DEC informed SMC that either a permit variance or a consent order continuance had to be requested. 44th Purdue Industrial Waste Conference Proceedings, © 1990 Lewis Publishers, Inc., Chelsea, Michigan 48118. Printed in U.S.A. 373 |
Resolution | 300 ppi |
Color Depth | 8 bit |
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